IEEE - Institute of Electrical and Electronics Engineers, Inc. - The experimental study on tree growth in XLPE using 3D PD patterns

Proceedings of the 6th International Conference on Properties and Applications of Dielectric Materials

Author(s): Guangning Wu ; Xiongwei Jiang ; Hengkun Xie ; Dae-Hee Park
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Xi'an, China
Conference Date: 21 June 2000
Volume: 1
ISBN (Paper): 0-7803-5459-1
DOI: 10.1109/ICPADM.2000.875755
Regular:

In order to reveal the mechanism of electrical tree growth in insulation, a 29 kV CN-CV cable sample is studied. The experiment is based on research for determination of the dependencies between... View More

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