IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dielectric characteristics of SF/sub 6/ gap and insulating spacer stressed by steep-fronted oscillating impulse voltages

Proceedings of the 6th International Conference on Properties and Applications of Dielectric Materials

Author(s): Qingguo Chen ; Qiaogen Zhang ; Yuchang Qiu ; Xinlao Wei ; Chun Ma
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Xi'an, China
Conference Date: 21 June 2000
Volume: 1
ISBN (Paper): 0-7803-5459-1
DOI: 10.1109/ICPADM.2000.875697
Regular:

Very fast transient overvoltages (VFTO) generated during disconnecters operation in GIS might cause insulation failure inside or outside GIS. Hence, the breakdown characteristics of GIS stressed... View More

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