IEEE - Institute of Electrical and Electronics Engineers, Inc. - Aging of interfaces by discharging

Proceedings of the 6th International Conference on Properties and Applications of Dielectric Materials

Author(s): Ross, R. ; Megens, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Xi'an, China
Conference Date: 21 June 2000
Volume: 1
ISBN (Paper): 0-7803-5459-1
DOI: 10.1109/ICPADM.2000.875673
Regular:

The paper gives an outline of ongoing work on interface reliability. It gives an outline of progress made within Cigre as well as at KEMA. The sample cell is found to perform quite well. Pressure... View More

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