IEEE - Institute of Electrical and Electronics Engineers, Inc. - A genetic algorithm based method for predicting far-field radiated emissions from near-field measurements

Proceedings of 2000 International Symposium on Electromagnetic Compatibility (EMC 2000)

Author(s): Regue, J.-R. ; Ribo, M. ; Garrell, J.-M. ; Sorroche, S. ; Ayuso, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Washington, DC, USA, USA
Conference Date: 21 August 2000
Volume: 1
ISBN (Paper): 0-7803-5677-2
DOI: 10.1109/ISEMC.2000.875553
Regular:

A novel method for predicting the radiated emissions of a device from near-field measurements is presented. It is based on the substitution (using a genetic algorithm) of the original device by an... View More

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