IEEE - Institute of Electrical and Electronics Engineers, Inc. - Improving SPC up to a one tolerance limit driven methodology

Proceedings of the 2000 IEEE Engineering Management Society. EMS - 2000

Author(s): Nenni, M.E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Albuquerque, NM, USA
Conference Date: 15 August 2000
Page(s): 35 - 39
ISBN (Paper): 0-7803-6442-2
DOI: 10.1109/EMS.2000.872472
Regular:

The aim of this paper is to introduce and check a new statistical process control technique that, integrating known theory, is able to improve its performance in presence of processes with only... View More

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