IEEE - Institute of Electrical and Electronics Engineers, Inc. - Evolution of barrier properties in magnetic tunnel junctions by annealing

INTERMAG Asia 2005: Digest of the IEEE International Magnetics Conference

Author(s): J. Schmalhorst ; A. Thomas ; M. Justus ; G. Reiss ; H. Bruckl ; M. Vieth ; G. Gieres ; J. Wecker
Sponsor(s): Magnetics Soc. of Japan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Toronto, ON, Canada, Canada
Conference Date: 9 April 2000
Page Count: 1
Page(s): 507
ISBN (Paper): 0-7803-5943-7
DOI: 10.1109/INTMAG.2000.872282
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