IEEE - Institute of Electrical and Electronics Engineers, Inc. - Electrostatic discharge testing of tunneling magnetoresistive (TMR) devices

INTERMAG Asia 2005: Digest of the IEEE International Magnetics Conference

Author(s): J. Hillman ; M. Sharma ; S.X. Wang
Sponsor(s): Magnetics Soc. of Japan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Toronto, ON, Canada, Canada
Conference Date: 9 April 2000
Page Count: 1
Page(s): 504
ISBN (Paper): 0-7803-5943-7
DOI: 10.1109/INTMAG.2000.872279
Advertisement