IEEE - Institute of Electrical and Electronics Engineers, Inc. - Evaluation of the in-situ UV oxidation technioue for tunnel-junction preparation

INTERMAG Asia 2005: Digest of the IEEE International Magnetics Conference

Author(s): E. Girgis ; H. Boeve ; J. De Boeck ; J. Schelten ; G. Borghs
Sponsor(s): Magnetics Soc. of Japan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Toronto, ON, Canada, Canada
Conference Date: 9 April 2000
Page Count: 1
Page(s): 364
ISBN (Paper): 0-7803-5943-7
DOI: 10.1109/INTMAG.2000.872139
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