IEEE - Institute of Electrical and Electronics Engineers, Inc. - Correlations among sputter pressure, thickness, and coercivity in co/cu magnetic thin films sputfer-deposited on si[001]

INTERMAG Asia 2005: Digest of the IEEE International Magnetics Conference

Author(s): J.J. Kelly ; J.F. MacKay ; E. Mateeva ; W.L. O'Brien ; M.G. Lagally
Sponsor(s): Magnetics Soc. of Japan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Toronto, ON, Canada, Canada
Conference Date: 9 April 2000
Page Count: 1
Page(s): 69
ISBN (Paper): 0-7803-5943-7
DOI: 10.1109/INTMAG.2000.871849
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