IEEE - Institute of Electrical and Electronics Engineers, Inc. - Study of in-depth defects using magneto-optical Kerr effect by measuring the magnetic hardness coeffient in magnetic thin film

INTERMAG Asia 2005: Digest of the IEEE International Magnetics Conference

Author(s): Siang Huei Leong ; Jian Ping Wang ; Teck Seng Low
Sponsor(s): Magnetics Soc. of Japan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Toronto, ON, Canada, Canada
Conference Date: 9 April 2000
Page Count: 1
Page(s): 47
ISBN (Paper): 0-7803-5943-7
DOI: 10.1109/INTMAG.2000.871827
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