IEEE - Institute of Electrical and Electronics Engineers, Inc. - Monte Carlo study of the lateral distribution of gate current density along the channel of submicron LDD MOSFET's

7th International Workshop on Computational Electronics. Book of Abstract. IWCE

Author(s): Harkar, A. ; Kelsall, R.W.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Glasgow, UK, UK
Conference Date: 22 May 2000
Page(s): 102 - 103
ISBN (Paper): 0-85261-704-6
DOI: 10.1109/IWCE.2000.869945
Regular:

This paper reports on a detailed simulation study of the spatial and energy distributions of hot electrons and their application in modelling gate current density profiles along the channel of a... View More

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