IEEE - Institute of Electrical and Electronics Engineers, Inc. - A case study in root cause defect analysis

Proceedings of International Conference on Software Engineering

Author(s): M. Leszak ; D.E. Perry ; D. Stoll
Sponsor(s): IEEE Comput. Soc. Tech. Council on Software Eng.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Limerick, Ireland, Ireland
Conference Date: 9 June 2000
Page Count: 10
Page(s): 428 - 437
ISBN (Paper): 1-58113-206-9
ISSN (Paper): 0270-5257
DOI: 10.1145/337180.337232
Regular:

There are three interdependent factors that drive our software development processes: interval, quality and cost. As market pressures continue to demand new features ever more rapidly, the... View More

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