IEEE - Institute of Electrical and Electronics Engineers, Inc. - Transient fault detection via simultaneous multithreading

Proceedings of 27th International Symposium on Computer Architecture

Author(s): Reinhardt, S.K. ; Mukherjee, S.S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Vancouver, BC, Canada
Conference Date: 14 June 2000
Page(s): 25 - 36
ISBN (Paper): 1-58113-232-8
ISSN (Paper): 1063-6897
Regular:

Smaller feature sizes, reduced voltage levels, higher transistor counts, and reduced noise margins make future generations of microprocessors increasingly prone to transient hardware faults. Most... View More

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