IEEE - Institute of Electrical and Electronics Engineers, Inc. - Experimental diagnostic of an industrial SF/sub 6/ PTFE confined circuit breaker

ICOPS 2000. IEEE Conference Record - Abstracts. 27th IEEE International Conference on Plasma Science

Author(s): Gentils, F. ; Fleurier, C. ; Fievet, C. ; Le Menn, E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: New Orleans, LA, USA, USA
Conference Date: 4 June 2000
ISBN (Paper): 0-7803-5982-8
ISSN (Paper): 0730-9244
DOI: 10.1109/PLASMA.2000.855171
Regular:

Summary form only given. An experimental study of an electrical arc has been achieved in an industrial SF/sub 6/ puffer circuit breaker using a PTFE nozzle as a quenching chamber. The arc was... View More

Advertisement