IEEE - Institute of Electrical and Electronics Engineers, Inc. - Electrodynamic beam loading and pulse shortening effects due to a intense relativistic electron beam/plasma

ICOPS 2000. IEEE Conference Record - Abstracts. 27th IEEE International Conference on Plasma Science

Author(s): Luginsland, J.W. ; Lau, Y.Y. ; Hendricks, K.J. ; Lemke, R.W. ; Haworth, M.D. ; Baca, C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: New Orleans, LA, USA, USA
Conference Date: 4 June 2000
ISBN (Paper): 0-7803-5982-8
ISSN (Paper): 0730-9244
DOI: 10.1109/PLASMA.2000.855130
Regular:

We report on investigations of the non-neutral plasma effects in HPM devices. We discuss how the intense space charge associated with the electron populations in HPM devices is sufficient to... View More

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