IEEE - Institute of Electrical and Electronics Engineers, Inc. - Near field diagnostics for HPM sources

ICOPS 2000. IEEE Conference Record - Abstracts. 27th IEEE International Conference on Plasma Science

Author(s): Hendricks, K.J. ; Coleman, P.D. ; Haworth, M.D. ; Clark, M.C. ; Gallegoes, R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: New Orleans, LA, USA, USA
Conference Date: 4 June 2000
ISBN (Paper): 0-7803-5982-8
ISSN (Paper): 0730-9244
DOI: 10.1109/PLASMA.2000.855128
Regular:

Summary form only given, as follows. The ability to diagnose the radiated pulse from an HPM source is difficult because of the power densities, collecting areas, and data cables employed. One... View More

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