IEEE - Institute of Electrical and Electronics Engineers, Inc. - Hg 185 nm and 254 nm resonance radiation production from a low pressure Hg-Ar discharge at high current densities

ICOPS 2000. IEEE Conference Record - Abstracts. 27th IEEE International Conference on Plasma Science

Author(s): Curry, J.J. ; Lawler, J.E. ; Lister, G.G.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: New Orleans, LA, USA, USA
Conference Date: 4 June 2000
ISBN (Paper): 0-7803-5982-8
ISSN (Paper): 0730-9244
DOI: 10.1109/PLASMA.2000.855104
Regular:

Summary form only given. The power radiated by each of the 185 nm and 254 nm resonance lines of Hg as a fraction of input power per unit length to the positive column has been measured in a low... View More

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