IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of the diffuse-to-hot spot attachment mode transition for high pressure arcs on thermionic cathodes

ICOPS 2000. IEEE Conference Record - Abstracts. 27th IEEE International Conference on Plasma Science

Author(s): Coulombe, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: New Orleans, LA, USA, USA
Conference Date: 4 June 2000
ISBN (Paper): 0-7803-5982-8
ISSN (Paper): 0730-9244
DOI: 10.1109/PLASMA.2000.855094
Regular:

Summary form only given. The arc attachment mode transition from a diffuse mode to a constricted, hot spot mode for high-pressure arcs on refractory (thermionic) cathodes is analyzed... View More

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