IEEE - Institute of Electrical and Electronics Engineers, Inc. - Use of localized self-induced plasmas to focus high energy electron beams

ICOPS 2000. IEEE Conference Record - Abstracts. 27th IEEE International Conference on Plasma Science

Author(s): Chen, P. ; Craddock, W. ; Decker, F. ; Iverson, R. ; King, F. ; Kirb, R. ; Kotseroglou, T. ; Ng, J. ; Walz, D. ; Yan, Y. ; Cline, D. ; Fukui, Y. ; Kumar, V. ; Colestock, P. ; Crawford, C. ; Noble, R. ; Katsouleas, T. ; Meyerhoger, D. ; Masuda, S. ; Ogata, A. ; Chattopadhyay, S. ; Sessler, A. ; Weidemann, A. ; Baldis, H. ; Bolton, P. ; Esparza, F. ; Foy, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: New Orleans, LA, USA, USA
Conference Date: 4 June 2000
ISBN (Paper): 0-7803-5982-8
ISSN (Paper): 0730-9244
DOI: 10.1109/PLASMA.2000.854989
Regular:

We have observed the focusing of high energy electron beams by self-induced gaseous plasmas. This work is being done in the Final Focus Test Beam line (FFTB) at the Stanford Linear Accelerator... View More

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