IEEE - Institute of Electrical and Electronics Engineers, Inc. - Using spherically bent crystals for obtaining high-resolution, large-field, monochromatic X-ray backlighting imaging for wide range of Bragg angles

ICOPS 2000. IEEE Conference Record - Abstracts. 27th IEEE International Conference on Plasma Science

Author(s): Pikuz, T.A. ; Faenov, A.Ya. ; Fraenkel, M. ; Zigler, A. ; Flora, F. ; Bollanti, S. ; Di Lazzaro, P. ; Letardi, T. ; Grilli, A. ; Palladino, L. ; Tomassetti, G. ; Reale, A. ; Reale, L. ; Scafati, A. ; Limongi, T. ; Bonfigli, F. ; Alainelli, L. ; Sanchez del Rio, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: New Orleans, LA, USA, USA
Conference Date: 4 June 2000
ISBN (Paper): 0-7803-5982-8
ISSN (Paper): 0730-9244
DOI: 10.1109/PLASMA.2000.854969

Summary form only given, as follows. The new advantages of well-known combination of a laser-produced X-ray plasma source and spherically bent crystal for the soft X-ray region backlighting scheme... View More