IEEE - Institute of Electrical and Electronics Engineers, Inc. - Spectroscopic investigations of X-ray radiation from X pinches

ICOPS 2000. IEEE Conference Record - Abstracts. 27th IEEE International Conference on Plasma Science

Author(s): Shelkovenko, T.A. ; Pikuz, S.A. ; Sinars, D.B. ; Scobelev, I.Yu. ; Hammer, D.A. ; Chandler, K.M. ; Min Hu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: New Orleans, LA, USA, USA
Conference Date: 4 June 2000
ISBN (Paper): 0-7803-5982-8
ISSN (Paper): 0730-9244
DOI: 10.1109/PLASMA.2000.854791
Regular:

Time-integrated X-ray spectroscopic measurements of the radiation produced by X pinches have been made using a focusing spectrograph based on a spherically bent mica crystal (R=100 mm). Spectra of... View More

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