IEEE - Institute of Electrical and Electronics Engineers, Inc. - Measurements of the structural evolution of X pinches and the formation of radiating hot spots

ICOPS 2000. IEEE Conference Record - Abstracts. 27th IEEE International Conference on Plasma Science

Author(s): Pikuz, S.A. ; Shelkovenko, T.A. ; Sinars, D.B. ; Hammer, D.A. ; Chandler, K.M. ; Min Hu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: New Orleans, LA, USA, USA
Conference Date: 4 June 2000
ISBN (Paper): 0-7803-5982-8
ISSN (Paper): 0730-9244
DOI: 10.1109/PLASMA.2000.854790
Regular:

In previous work on the X pinch (XP) facility (470 kA, 100 ns), we found that an on-axis z pinch forms in the cross point region during the final few ns prior to the radiation bursts. The rapid... View More

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