IEEE - Institute of Electrical and Electronics Engineers, Inc. - Comparative analysis of metal and optical interconnect technology

Proceedings of the IEEE 2000 International Interconnect Technology Conference

Author(s): Jiang, D. ; Bhuva, B.L. ; Kerns, D.V., Jr. ; Kerns, S.E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Burlingame, CA, USA
Conference Date: 7 June 2000
Page(s): 25 - 27
ISBN (Paper): 0-7803-6327-2
DOI: 10.1109/IITC.2000.854270
Regular:

Barriers to industrial implementation of optical interconnects on an IC center on the balance between power requirements and speed improvements over existing metal interconnect systems. This paper... View More

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