IEEE - Institute of Electrical and Electronics Engineers, Inc. - Comparison of key performance metrics in two- and three-dimensional integrated circuits

Proceedings of the IEEE 2000 International Interconnect Technology Conference

Author(s): Rahman, A. ; Fan, A. ; Reif, R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Burlingame, CA, USA
Conference Date: 7 June 2000
Page(s): 18 - 20
ISBN (Paper): 0-7803-6327-2
DOI: 10.1109/IITC.2000.854268
Regular:

In this paper some key performance metrics in two-dimensional (2-D) and three-dimensional (3-D) integrated circuits (IC) are estimated for scaled technologies from 250-nm to 50-nm technology nodes... View More

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