IEEE - Institute of Electrical and Electronics Engineers, Inc. - Qualification and reliability tests: What are we doing and why?

2000 Proceedings. 50th Electronic Components and Technology Conference

Author(s): Munroe, R.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Las Vegas, NV, USA, USA
Conference Date: 21 May 2000
Page(s): 1,576 - 1,581
ISBN (Paper): 0-7803-5908-9
DOI: 10.1109/ECTC.2000.853425
Regular:

The semiconductor industry and its customers perform component qualification tests and reliability tests that are reasonably similar if not the same due to the standards in the industry and... View More

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