IEEE - Institute of Electrical and Electronics Engineers, Inc. - Novel, high density R/C terminating networks

2000 Proceedings. 50th Electronic Components and Technology Conference

Author(s): Schaper, L. ; Ulrich, R. ; Gross, C. ; Parkerson, P.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Las Vegas, NV, USA, USA
Conference Date: 21 May 2000
Page(s): 1,560 - 1,563
ISBN (Paper): 0-7803-5908-9
DOI: 10.1109/ECTC.2000.853421
Regular:

Integrated 100 pF/50 /spl Omega/ R/C terminators with an 0402 footprint were designed, fabricated and evaluated on Si and glass substrates. These structures consisted of compound anodized Ta... View More

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