IEEE - Institute of Electrical and Electronics Engineers, Inc. - Highly accelerated life testing for non-hermetic laser modules

2000 Proceedings. 50th Electronic Components and Technology Conference

Author(s): Theis, C.D. ; Siconolfi, D.J. ; Comizzoli, R.B. ; Kiely, P.A. ; Wu, P. ; Chakrabarti, U.K. ; Osenbach, J.W.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Las Vegas, NV, USA, USA
Conference Date: 21 May 2000
Page(s): 955 - 961
ISBN (Paper): 0-7803-5908-9
DOI: 10.1109/ECTC.2000.853282
Regular:

Reliability testing using accelerators such as temperature and humidity for electronic components has evolved from conventional temperature/humidity/bias (THB) testing (85/spl deg/C/85%... View More

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