IEEE - Institute of Electrical and Electronics Engineers, Inc. - A technique for the characterization of multi-terminal capacitors for high frequency applications

2000 Proceedings. 50th Electronic Components and Technology Conference

Author(s): Figueroa, D.G. ; Li, Y.L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Las Vegas, NV, USA, USA
Conference Date: 21 May 2000
Page(s): 445 - 448
ISBN (Paper): 0-7803-5908-9
DOI: 10.1109/ECTC.2000.853193
Regular:

This paper discusses the characterization of multi-terminal capacitors through a range of frequencies that have a known importance to leading microprocessor technologies. This will cover the... View More

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