IEEE - Institute of Electrical and Electronics Engineers, Inc. - Statistical analysis of embedded capacitors using Monte Carlo simulation

2000 Proceedings. 50th Electronic Components and Technology Conference

Author(s): Carastro, L. ; Ilgu Yun ; Poddar, R. ; Brooke, M. ; May, G.S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Las Vegas, NV, USA, USA
Conference Date: 21 May 2000
Page(s): 198 - 205
ISBN (Paper): 0-7803-5908-9
DOI: 10.1109/ECTC.2000.853147
Regular:

In this paper we describe a method of accurately modeling new passive devices by deembedding the many building blocks, from which they are built, using just a few test structures. We use a... View More

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