IEEE - Institute of Electrical and Electronics Engineers, Inc. - Processability and reliability of commercial palladium plated structures

2000 Proceedings. 50th Electronic Components and Technology Conference

Author(s): Chan, K.C. ; Chai, T.C. ; Yang, Y.Z. ; Gopalalaishan, R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Las Vegas, NV, USA, USA
Conference Date: 21 May 2000
Page(s): 175 - 182
ISBN (Paper): 0-7803-5908-9
DOI: 10.1109/ECTC.2000.853143
Regular:

This paper summaries the processability and board level reliability of five commercial plated leadframe structures. Extensive surface analysis has been performed on these Pd plated structures... View More

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