IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliability test target development

Proceedings of 46th International Symposium on Reliability and Maintainability - Product Quality and Integrity

Author(s): Ming-Wei Lu ; Rudy, R.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Los Angeles, CA, USA, USA
Conference Date: 24 January 2000
Page(s): 77 - 81
ISBN (Paper): 0-7803-5848-1
ISSN (Paper): 0149-144X
DOI: 10.1109/RAMS.2000.816287
Regular:

An automotive company's goal is to design and manufacture vehicles that will meet the needs and the expectations of the customers. It is essential for the design engineer to understand and take... View More

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