IEEE - Institute of Electrical and Electronics Engineers, Inc. - X-ray spot measurement and modulation transfer function for the 12 MeV LIA

IEEE Conference Record - Abstracts. 1999 IEEE International Conference on Plasma Science. 26th International Conference

Author(s): Shi Jinshui ; Li Jing ; Li Qing ; Luo Dashi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Monterey, CA, USA, USA
Conference Date: 24 June 1999
ISBN (Paper): 0-7803-5224-6
ISSN (Paper): 0730-9244
DOI: 10.1109/PLASMA.1999.829710
Regular:

Summary form only given. This paper is intended to present the experimental system measuring the X-ray spot size for the 12 MeV LIA. By means of one-time discharge, the system adopts the... View More

Advertisement