IEEE - Institute of Electrical and Electronics Engineers, Inc. - Material field strength studies at microsecond pulsed voltages

IEEE Conference Record - Abstracts. 1999 IEEE International Conference on Plasma Science. 26th International Conference

Author(s): Shiffler, D. ; Lacour, M. ; Hendricks, K. ; Umstattd, R. ; Spencer, T. ; Haworth, M. ; Vozz, D. ; Lovesee, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Monterey, CA, USA, USA
Conference Date: 24 June 1999
ISBN (Paper): 0-7803-5224-6
ISSN (Paper): 0730-9244
DOI: 10.1109/PLASMA.1999.829688
Regular:

Summary form only given. High power microwave tubes typically all share the same characteristic in that large electric field stresses, both pulsed and RF, can be present in the tube. These large... View More

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