IEEE - Institute of Electrical and Electronics Engineers, Inc. - X-ray and EUV diagnostics for the Nevada Terawatt Facility: plasma imaging, spectroscopy, and polarimetry

IEEE Conference Record - Abstracts. 1999 IEEE International Conference on Plasma Science. 26th International Conference

Author(s): Kantsyrev, V.L. ; Bauer, B.S. ; Mancini, R.C. ; Shlyaptseva, A.S. ; Fdin, D.A. ; Golovkin, A. ; Hakel, P. ; Paraschiv, I. ; Ammons, N. ; Hansen, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Monterey, CA, USA, USA
Conference Date: 24 June 1999
ISBN (Paper): 0-7803-5224-6
ISSN (Paper): 0730-9244
DOI: 10.1109/PLASMA.1999.829679
Regular:

Summary form only given. A wide variety of advanced extreme ultraviolet (EUV) and X-ray diagnostics are being developed for the Nevada Terawatt Facility (NTF) at the University of Nevada, Reno.... View More

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