IEEE - Institute of Electrical and Electronics Engineers, Inc. - Radiation trapping of the Hg 185 nm resonance line

IEEE Conference Record - Abstracts. 1999 IEEE International Conference on Plasma Science. 26th International Conference

Author(s): Lawler, J.E. ; Curry, J.J. ; Mennigen, K.L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Monterey, CA, USA, USA
Conference Date: 24 June 1999
ISBN (Paper): 0-7803-5224-6
ISSN (Paper): 0730-9244
DOI: 10.1109/PLASMA.1999.829631
Regular:

Summary form only given. The trapped decay rate of the 6/sup 1/P/sub 1/ level at 185 nm was measured as a function of cold spot temperature (Hg density) and buffer gas pressure in cylindrical... View More

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