IEEE - Institute of Electrical and Electronics Engineers, Inc. - Review of electrical resistivity measurements of dense aluminum

IEEE Conference Record - Abstracts. 1999 IEEE International Conference on Plasma Science. 26th International Conference

Author(s): Benage, J.F., Jr. ; Shanahan, W.R. ; Murillo, M.S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Monterey, CA, USA, USA
Conference Date: 24 June 1999
ISBN (Paper): 0-7803-5224-6
ISSN (Paper): 0730-9244
DOI: 10.1109/PLASMA.1999.829586
Regular:

Summary form only given. We have completed an analysis of recent experiments that were done at Los Alamos and other laboratories that measured the electrical resistivity of aluminum at conditions... View More

Advertisement