IEEE - Institute of Electrical and Electronics Engineers, Inc. - Comparisons of particle tracking and charge deposition schemes for a finite element gun code

IEEE Conference Record - Abstracts. 1999 IEEE International Conference on Plasma Science. 26th International Conference

Author(s): Nelson, E.M. ; Eppley, K.R. ; Petillo, J.J. ; Humphries, S., Jr.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Monterey, CA, USA, USA
Conference Date: 24 June 1999
ISBN (Paper): 0-7803-5224-6
ISSN (Paper): 0730-9244
DOI: 10.1109/PLASMA.1999.829510
Regular:

Summary form only given, as follows. A new finite element gun code is under development. In an effort to improve the gun code model, a concept has been proposed recently that treats fields in a... View More

Advertisement