IEEE - Institute of Electrical and Electronics Engineers, Inc. - Intrinsic Resitivity Nickel and Gold Thin Film Bolometers for Pulsed X-ray Measurements

IEEE Conference Record - Abstracts. 1999 IEEE International Conference on Plasma Science. 26th International Conference

Author(s): McGurn, J. ; McKenney, J. ; Deeney, C. ; Coverdale, C.A. ; Spielman, R.B. ; Fehl, D. ; Ryan, P. ; Chandler, G.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Monterey, CA, USA, USA
Conference Date: 24 June 1999
Page(s): 176
ISBN (Paper): 0-7803-5224-6
ISSN (Paper): 0730-9244
DOI: 10.1109/PLASMA.1999.829447
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