IEEE - Institute of Electrical and Electronics Engineers, Inc. - Flash X-ray diagnostics of argon jets: X-ray induced fluorescence imaging and radiography

IEEE Conference Record - Abstracts. 1999 IEEE International Conference on Plasma Science. 26th International Conference

Author(s): Hure, L. ; Robert, E. ; Cachoncinlle, C. ; Viladrosa, R. ; Pouvesle, J.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Monterey, CA, USA, USA
Conference Date: 24 June 1999
ISBN (Paper): 0-7803-5224-6
ISSN (Paper): 0730-9244
DOI: 10.1109/PLASMA.1999.829436
Regular:

Summary form only given. In this work we report on the development and application of two flash X-ray diagnostic techniques. A compact X-ray source specially designed for these studies was used to... View More

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