IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analyzer for profile measurement of a beam from a magnicon electron gun

IEEE Conference Record - Abstracts. 1999 IEEE International Conference on Plasma Science. 26th International Conference

Author(s): Gold, S.H. ; Kinkead, A.K. ; Fliflet, A.W. ; True, R. ; Hansen, R.J. ; Hirshfield, J.L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Monterey, CA, USA, USA
Conference Date: 24 June 1999
ISBN (Paper): 0-7803-5224-6
ISSN (Paper): 0730-9244
DOI: 10.1109/PLASMA.1999.829430
Regular:

Summary from only given, as follows. A key parameter in determining the efficiency of a magnicon amplifier is the quality of the electron beam used to drive the device, and in particular the... View More

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