IEEE - Institute of Electrical and Electronics Engineers, Inc. - Spherically curved crystals for X-ray plasma diagnostics

IEEE Conference Record - Abstracts. 1999 IEEE International Conference on Plasma Science. 26th International Conference

Author(s): Aglitskiy, Y. ; Lehecka, T. ; Obenschain, S. ; Pawley, C. ; Brown, C.M. ; Seely, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Monterey, CA, USA, USA
Conference Date: 24 June 1999
ISBN (Paper): 0-7803-5224-6
ISSN (Paper): 0730-9244
DOI: 10.1109/PLASMA.1999.829353
Regular:

Summary form only given. We report on our continued development of the X-ray plasma diagnostics based on spherically curved crystals. The diagnostics include X-ray spectroscopy with 1D spatial... View More

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