IEEE - Institute of Electrical and Electronics Engineers, Inc. - Spectroscopic measurement of packaging induced strains in high-power laser diode arrays

Technical Digest. Summaries of papers presented at the Conference on Lasers and Electro-Optics. Postconference Edition. CLEO '99. Conference on Lasers and Electro-Optics

Author(s): J.W. Tomm ; R. Muller ; A. Barwolff ; T. Elsaesser ; A. Gerhardt ; J. Donecker ; D. Lorenzen ; F.X. Daiminger ; S. Weiss ; M. Hutter ; H. Reichl
Sponsor(s): IEEE/Lasers & Electro-Opt. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Baltimore, MD, USA, USA
Conference Date: 28 May 1999
Page Count: 2
Page(s): 145 - 146
ISBN (Paper): 1-55752-595-1
DOI: 10.1109/CLEO.1999.834006
Regular:

Summary form only given. High-power diode lasers are important for a wide range of applications, e.g. as pump sources for solid state lasers and tools for material processing. For managing the... View More

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