IEEE - Institute of Electrical and Electronics Engineers, Inc. - Novel technique for evaluation of optical confinement in semiconductor lasing structures through spatially and spectrally resolved emission spectra

Technical Digest. Summaries of papers presented at the Conference on Lasers and Electro-Optics. Postconference Edition. CLEO '99. Conference on Lasers and Electro-Optics

Author(s): S. Bidnyk ; T.J. Schmidt ; B.D. Little ; J. Krasinski ; J.J. Song
Sponsor(s): IEEE/Lasers & Electro-Opt. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Baltimore, MD, USA, USA
Conference Date: 28 May 1999
Page Count: 1
ISBN (Paper): 1-55752-595-1
DOI: 10.1109/CLEO.1999.834005
Regular:

Summary form only given. At present, the main focus of III-V nitride research is the optimization of current-injected laser diodes in order to achieve a low lasing threshold and extend the... View More

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