IEEE - Institute of Electrical and Electronics Engineers, Inc. - Demonstration of newly invented negative-mask scanning imaging scheme using THz-radiation sources

Technical Digest. Summaries of papers presented at the Conference on Lasers and Electro-Optics. Postconference Edition. CLEO '99. Conference on Lasers and Electro-Optics

Author(s): S. Ono ; H. Ohtake ; S. Izumida ; T. Yano ; M. Sakai ; Z. Liu ; Y. Nakayama ; T. Tsukamoto ; N. Sarukura
Sponsor(s): IEEE/Lasers & Electro-Opt. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Baltimore, MD, USA, USA
Conference Date: 28 May 1999
Page Count: 2
Page(s): 118 - 119
ISBN (Paper): 1-55752-595-1
DOI: 10.1109/CLEO.1999.833965
Regular:

Summary form only given. There have been strong demands for a new imaging scheme with limited light source intensity for various imaging applications. Additionally, there is no detector array with... View More

Advertisement