IEEE - Institute of Electrical and Electronics Engineers, Inc. - Direct measurement of optical phase in the near-field

Technical Digest. Summaries of papers presented at the Conference on Lasers and Electro-Optics. Postconference Edition. CLEO '99. Conference on Lasers and Electro-Optics

Author(s): P.L. Phillips ; J.C. Knight ; P.St.J. Russell ; G. Kakarantzas ; J.M. Pottage
Sponsor(s): IEEE/Lasers & Electro-Opt. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Baltimore, MD, USA, USA
Conference Date: 28 May 1999
Page Count: 2
Page(s): 69 - 70
ISBN (Paper): 1-55752-595-1
DOI: 10.1109/CLEO.1999.833892
Regular:

Summary form only given. Traditionally, the most common measurement in optics is of electromagnetic field intensity. However, to fully characterise guided wave optical devices, one requires... View More

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