IEEE - Institute of Electrical and Electronics Engineers, Inc. - Device SEE susceptibility update: 1996-1998

1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference

Author(s): Coss, J.R. ; Miyahira, T.F. ; Selva, L.E. ; Swift, G.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Norfolk, VA, USA, USA
Conference Date: 12 July 1999
Page(s): 60 - 81
ISBN (Paper): 0-7803-5660-8
DOI: 10.1109/REDW.1999.816058
Regular:

This eighth Compendium continues the previous work of Nichols, et al., on single event effects (SEE) first published in 1985. Because the Compendium has grown so voluminous, this update only... View More

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