IEEE - Institute of Electrical and Electronics Engineers, Inc. - Single event upset characteristics of some digital integrated frequency synthesizers

1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference

Author(s): Dayaratna, L. ; Seehra, S.S. ; Bogorad, A. ; Ramos, L.G.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Norfolk, VA, USA, USA
Conference Date: 12 July 1999
Page(s): 46 - 52
ISBN (Paper): 0-7803-5660-8
DOI: 10.1109/REDW.1999.816056
Regular:

Frequency generation circuits can be designed by using digital integrated circuit frequency synthesizers containing phase locked loops. Many circuits in ECL, Bi-CMOS and CMOS-SOS technology... View More

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