IEEE - Institute of Electrical and Electronics Engineers, Inc. - Recent radiation damage and single event effect results for microelectronics

1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference

Author(s): O'Bryan, M.V. ; LaBel, K.A. ; Reed, R.A. ; Howard, J.W. ; Barth, J.L. ; Seidleck, C.M. ; Marshall, P.W. ; Marshall, C.J. ; Kim, H.S. ; Hawkins, D.K. ; Carts, M.A. ; Forslund, K.E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Norfolk, VA, USA, USA
Conference Date: 12 July 1999
Page(s): 1 - 14
ISBN (Paper): 0-7803-5660-8
DOI: 10.1109/REDW.1999.816042
Regular:

We present heavy ion and proton single event effects (SEE) as well as radiation damage ground test results for candidate spacecraft electronics. Microelectronics tested include digital, analog,... View More

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