IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multifractal texture analysis and classification

Proceedings of 6th International Conference on Image Processing (ICIP'99)

Author(s): Anh, V.V. ; Maeda, J. ; Tieng, Q.M. ; Tsui, H.T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Kobe, Japan, Japan
Conference Date: 24 October 1999
Volume: 4
ISBN (Paper): 0-7803-5467-2
DOI: 10.1109/ICIP.1999.819633
Regular:

Existing fractal methods of texture analysis rely on the fractal dimension of textures as a function of scale for their discrimination and classification. We propose a method which is based on the... View More

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