IEEE - Institute of Electrical and Electronics Engineers, Inc. - CONLOAD-a new lot release rule for semiconductor wafer fabs

Proceedings of 1999 Winter Conference on Simulation

Author(s): Rose, O.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Phoenix, AZ, USA
Conference Date: 5 December 1999
Volume: 1
ISBN (Paper): 0-7803-5780-9
DOI: 10.1109/WSC.1999.823297
Regular:

We present CONLOAD (CONstant LOAD), a new lot release rule for wafer fabs. It was developed to overcome some performance problems of traditional lot release rules such as CONWIP or Workload... View More

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